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Understanding Critical Specifications for Dynamic Metrology Applications
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"Understanding Critical Specifications for Dynamic Metrology Applications"

Different types of metrology have different critical specifications to consider when determining which actuator technology to use.

The demand for high precision, electromechanical motion control has been continuously growing in step with the markets they serve. These markets, including semiconductor, electronics manufacturing, photonics, and life sciences, all have technology being driven forward per Moore’s Law.

This white paper goes into detail on the demands of dynamic metrology applications as they apply to the selection of precision linear motion control components and systems. In addition, the relevance of Moore's Law is examined in the context of the industry.

Offered Free by: and Parker Hannifin
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